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DOI: 10.1016/j.engfailanal.2020.105108
http://dx.doi.org/10.1016/j.engfailanal.2020.105108Author(s): Dogan, Erkan; Yurdusev, Mehmet Ali; Yildizel, Sadik Alper; Calis, Gokhan
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Publisher: Elsevier Science
Date: 2021-02-01
Volume: 120
Issue: -1
ISSN:
First Page: 105108
Last Page: -1
File Type: PDF
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DOI: 10.1016/j.jmsy.2018.12.002,Author(s): Isa, Mohammed A.; Lazoglu, Ismail, Journal: , Publisher: Society of Manufacturing Engineers
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DOI: 10.1016/j.engfailanal.2020.105108,Author(s): Dogan, Erkan; Yurdusev, Mehmet Ali; Yildizel, Sadik Alper; Calis, Gokhan, Journal: , Publisher: Elsevier Science
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DOI: 10.1109/ICISC.2018.8398954,Author(s): Suresh, R; Rao, A. Nagaraja; Reddy, B. Eswara, Journal: , Publisher: Institute of Electrical and Electronics Engineers
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DOI: 10.1109/ICISC.2018.8398960,Author(s): Meenal, R.; Selvakumar, A. Immanuel; Brighta, K.; Joice, S. Christy Jeba; Richerd, C.P., Journal: , Publisher: Institute of Electrical and Electronics Engineers
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DOI: 10.1109/ICISC.2018.8398992,Author(s): Kamath, Dattaguru V., Journal: , Publisher: Institute of Electrical and Electronics Engineers
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DOI: 10.1109/ICISC.2018.8399002,Author(s): Vijayalakshmi, S. R.; Muruganand, S., Journal: , Publisher: Institute of Electrical and Electronics Engineers
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DOI: 10.1109/ICISC.2018.8399005,Author(s): Kumar, Vineet, Journal: , Publisher: Institute of Electrical and Electronics Engineers
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DOI: 10.1109/ICISC.2018.8399009,Author(s): Anupriya, C.; Menon, Sreedevi K., Journal: , Publisher: Institute of Electrical and Electronics Engineers
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DOI: 10.1109/ICISC.2018.8399011,Author(s): Reddy, M Chaitanya Kishore; Sujana, Arani; Sujita, Arani; Rudroj, Kriti, Journal: , Publisher: Institute of Electrical and Electronics Engineers
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DOI: 10.1109/ICISC.2018.8399021,Author(s): Verma, Gaurav; Dhage, Vinayak; Chauhan, Sudakar Singh, Journal: , Publisher: Institute of Electrical and Electronics Engineers